Review of Transverse Beam Profile Measurements Using Synchrotron Radiation

Emy Mulyani, J.W. Flanagan

Abstract


Abstract –Synchrotron radiation (SR) is a tool for non-destructive beam diagnostics since its characters are substantially related to those of the source beam. The spectrum of SR is extremely intense and extends over a broad energy range from the infrared through the visible and ultraviolet, into the soft and hard X-ray regions of the electromagnetic spectrum. The visible light (400 – 800 nm) and X-ray (0.05 – 0.3 nm) regions are used in the beam instrumentation. In the visible light region, transverse beam profile or size diagnostics can be done by an interferometer (light is observed as a wave). Meanwhile, in the submicron beam size measurements, the X-ray SR monitor is commonly used. This paper reports the review of transverse beam profile measurements using SR covering principles and practical experiences with the technique at some accelerator facilities such as Photon Factory, Diamond Light Source, CesrTA, and SuperKEKB.

Key words: accelerator, beam instrumentation, transverse beam profile, synchrotron radiation, X-ray, visible light


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DOI: https://doi.org/10.35895/jpsi.v1i1.149

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